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IEC PAS 62206:2000

IEC PAS 62206:2000

Power and temperature cycling

2000-11-28 /Anulada
Resumen (inglés):
Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.
Resumen (francés):

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