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Norma
IEC 61445:2012

IEC 61445:2012

Digital Test Interchange Format (DTIF)

Fecha:
2012-06-21 /Vigente
Resumen (inglés):
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.
Resumen (francés):

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