Saltar navegación principal
IEC PAS 62177:2000

IEC PAS 62177:2000

Highly-accelerated temperature and humidity stress test (HAST)

2000-08-24 /Anulada
Resumen (inglés):
The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Resumen (francés):

Comprar en AENOR

Esta norma está disponible en:

Formato digital