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Norma
IEC PAS 62175:2000

IEC PAS 62175:2000

Marking permanency test method

Fecha:
2000-08-24 /Anulada
Resumen (inglés):
Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
Resumen (francés):

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