IEC 60749-27:2003

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 27: Essai de sensibilité aux décharges électrostatiques (DES) - Modèle de machine (MM)

Fecha:

2006-07-18 /Anulada

Resumen (inglés):

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Resumen (francés):

Relaciones con otras normas IEC

Es anulada por: IEC 60749-27:2006
Anula a: IEC PAS 62180:2000

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