IEC 60147-2C:1970

Supplement C - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

Complément C - Valeurs limites et caractéristiques essentielles des dispositifs à semiconducteurs et principes généraux des méthodes de mesure - Partie 2: Principes généraux des méthodes de mesure

Fecha:

1995-03-31 /Anulada

Resumen (inglés):

Deals with transistors and considers collector-base capacitance of transistors, gives voltage ratings and measurable characteristics limiting the working voltages, indicates methods of measuring thermal resistance and defines switching and high- frequency parameters.

Resumen (francés):

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