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IEC 61788-17:2013

IEC 61788-17:2013

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

Supraconductivité - Partie 17: Mesures de caractéristiques électroniques - Densité de courant critique local et sa distribution dans les films supraconducteurs de grande surface

Fecha:
2021-04-28 /Anulada
Resumen (inglés):
IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.
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