Saltar navegación principal
Norma
IEC 60749-41:2020

IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 41: Méthodes d’essai normalisées pour la fiabilité des dispositifs à mémoire non volatile

Fecha:
2020-07-22 /Vigente
Resumen (inglés):
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
Resumen (francés):

Comprar en AENOR

Esta norma está disponible en:

Formato digital

Bilingue