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IEC 60749-25:2003

IEC 60749-25:2003

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 25: Cycles de température

Fecha:
2003-07-11 /Vigente
Resumen (inglés):
Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.
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