IEC 60749-12:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables

Fecha:

2017-12-13 /Anulada

Resumen (inglés):

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Resumen (francés):

Relaciones con otras normas IEC

Es modificada por: IEC 60749-12:2002/COR1:2003
Es anulada por: IEC 60749-12:2017
Anula a: IEC PAS 62187:2000

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