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IEC 62899-402-1:2017

IEC 62899-402-1:2017

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

2017-03-03 /Vigente
Resumen (inglés):
IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
Resumen (francés):

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