Saltar navegación principal
Norma
IEC 62899-402-1:2017

IEC 62899-402-1:2017

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

Fecha:
2017-03-03 /Vigente
Resumen (inglés):
IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
Resumen (francés):

Comprar en AENOR

Esta norma está disponible en:

Formato digital

Inglés