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Norma
IEC PAS 62191:2000

IEC PAS 62191:2000

Acoustic microscopy for nonhermetic encapsulated electronic components

Fecha:
2002-01-31 /Anulada
Resumen (inglés):
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.
Resumen (francés):

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