Home>Encuentra tu norma>Busca tu norma>IEC
Norma
IEC 60749-29:2003

IEC 60749-29:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 29: Essai de verrouillage

Fecha:
2011-04-07 /Anulada
Resumen (inglés):
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.
Resumen (francés):
Relaciones con otras normas IEC

Comprar en AENOR

Esta norma está disponible en:

Formato digital

Bilingue