Resumen (inglés):
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
