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Norma
IEC 61163-2:1998

IEC 61163-2:1998

Reliability stress screening - Part 2: Electronic components

Déverminage sous contraintes - Partie 2: Composants électroniques

Fecha:
2020-03-11 /Anulada
Resumen (inglés):
Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.
Resumen (francés):
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