Saltar navegación principal
Norma
IEC 62951-5:2019

IEC 62951-5:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 5 : Méthode d’essai pour les caractéristiques thermiques des matériaux souples

Fecha:
2019-02-27 /Vigente
Resumen (inglés):
IEC 62951-5:2019 specifies the test method for thermal characteristics of flexible materials. This document includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use. The measurement method relies on non-contact optical thermometry that is based on temperature dependent optical reflectance. This document is applicable to both substrate and thin-film flexible semiconductor materials that are subjected to bending and stretching.
Resumen (francés):

Comprar en AENOR

Esta norma está disponible en:

Formato digital

Bilingue