Saltar navegación principal
Norma
IEC 60444-8:2003

IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Mesure des paramètres des résonateurs à quartz - Partie 8: Dispositif d'essai pour les résonateurs à quartz montés en surface

Fecha:
2016-12-15 /Anulada
Resumen (inglés):
Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.
Resumen (francés):
Relaciones con otras normas IEC

Comprar en AENOR

Esta norma está disponible en:

Formato digital

Ingles / Bilingue