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Norma
IEC 60410:1973

IEC 60410:1973

Sampling plans and procedures for inspection by attributes

Plans et règles d'échantillonnage pour les contrôles par attributs

Fecha:
2015-10-30 /Anulada
Resumen (inglés):
Establishes sampling plans and procedures for inspection by attributes. These sampling plans are applicable, but not limited, to inspection of end items, components and raw materials, operations, materials in process, supplies in storage, maintenance operations, data or records and administrative procedures.
Resumen (francés):

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Formato digital

Ingles / Frances / Bilingue