IEC 60333:1993

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

Instrumentation nucléaire - Détecteurs semiconducteurs pour particules chargées - Méthodes d'essai

Fecha:

2010-07-15 /Anulada

Resumen (inglés):

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

Resumen (francés):

Relaciones con otras normas IEC

Anula a: IEC 60333:1983

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