IEC 60147-0:1966

Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology

Valeurs limites et caractéristiques essentielles des dispositifs à semiconducteurs et principes généraux des méthodes de mesure - Partie 0: Généralités et terminologie

Fecha:

1995-03-31 /Anulada

Resumen (inglés):

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

Resumen (francés):

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